Field Emission Scanning Electron Microscope (FESEM) and Energy Dispersive Spectroscopy (EDS)

HASETRI has established an enhanced research facility by providing advance analytical instruments and support for carrying out specialized analysis for samples of several kinds. 

Field Emission Scanning Electron Microscope (FESEM) is used for detailed topographic study of any surfaces. It provides surface image from 10X to 10,00,000X magnification.  

EDS- Energy Dispersive Spectroscopy detect X-rays with unique energies for characteristic elements which is emitted from the sample surface, and this characterizes the elemental composition. It is capable of selective element mapping, line scan, selected area analysis, multipoint analysis, qualitative and quantitative analysis.

FESEM Applications

FESEM is applicable for characterizing wide range of samples; ranging from biological to metallurgical, from ceramic to polymeric, everywhere.
Surface morphology, topography and texture of materials can be well understood from FESEM image
It can be used to differentiate the phases in blends and composites and provides the information regarding the distribution and dispersion of fillers onto the polymeric matrices
It plays a major role in failure analysis of products during service
It is able to identify contamination or presence of any foreign materials through EDS spectra and elemental mapping.

FESEM images of MWCNT & Black Filled Rubber Compound

SEM Images, Spectra & Elemental Mapping fom EDS

TEM Applications

A Transmission Electron Microscope is ideal for a number of different fields such as life sciences, nanotechnology, medical, biological and material research, forensic analysis, gemology and metallurgy as well as industry and education.
TEM provides topographical, morphological, compositional and crystalline information.
The images allow researchers to view samples on a molecular level, making it possible to analyse structure and texture. This information is useful in the study of crystals and metals and also has industrial applications.
TEM can be used in semiconductor analysis and production & manufacturing of computer and silicon chips.
Technology companies use TEMs to identify flaws, fractures and damages to micro-sized objects; this data can help fix problems and/or help to make a more durable, efficient product.